Prof Sir Colin Humphreys
CBE, FREng, FRS, BSc, MA, PhD, Hon DSc, FIMMM, FInstP, FCGI, Hon FRMS

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All Publications

Page 9 of 10

1990

• The interaction of electron beams with solids - Some new effects
  Humphreys CJ, Bullough TJ, Devenish RW, Maher DM, Turner PS
  Proceedings, Annual Meeting, Electron Microscopy Society of America, Cambridge University Press (Cup) vol. 48 (4), 788-789.  
  DOI 10.1017/s0424820100177076
  
  01-08-1990
• Nanometre hole formation in MgO using electron beams
  Turner PS, Bullough TJ, Devenish RW, Maher DM, Humphreys CJ
  Philosophical Magazine Letters, Informa Uk Limited vol. 61 (4), 181-193.  
  DOI 10.1080/09500839008202357
  
  01-04-1990
• On the microstructural evolution of sintered Bi-Sr-Ca-Cu-O high-T_csuperconductors
  Zhang JG, McCartney DG, Humphreys CJ
  Superconductor Science and Technology, IOP Publishing vol. 3 (4), 185-190.  
  DOI 10.1088/0953-2048/3/4/006
  
  01-04-1990

1989

• Book Review: Transmission Electron Microscopy. By L. Reimer
  Humphreys CJ
  Angewandte Chemie International Edition in English, Wiley vol. 28 (12), 1763-1764.  
  DOI 10.1002/anie.198917631
  
  01-12-1989
• Transmission Electron Microscopy. By L. Reimer. Springer Series in Optical Sciences, Springer‐Verlag, Second Edition, 1989, xiii, 547 pp., paperback, DM 128. – ISBN 3‐540‐50499‐0
  Humphreys CJ
  Angewandte Chemie, Wiley vol. 101 (12), 1803-1804.  
  DOI 10.1002/ange.19891011265
  
  01-12-1989
• Controlling crystal growth
  Humphreys C
  Nature, Springer Science and Business Media Llc vol. 341 (6244), 689-689.  
  DOI 10.1038/341689a0
  
  26-10-1989
• Materials Science and Engineering in Britain
  Humphreys C
  Angewandte Chemie International Edition in English, Wiley vol. 28 (8), 1077-1078.  
  DOI 10.1002/anie.198910771
  
  01-08-1989
• Dislocation nucleation near the critical thickness in GeSi/Si strained layers
  Eaglesham DJ, Kvam EP, Maher DM, Humphreys CJ, Bean JC
  Philosophical Magazine A, Informa Uk Limited vol. 59 (5), 1059-1073.  
  DOI 10.1080/01418618908209837
  
  01-05-1989
• Nanolithography using field emission and conventional thermionic electron sources
  Devenish RW, Eaglesham DJ, Maher DM, Humphreys CJ
  Ultramicroscopy, Elsevier Bv vol. 28 (1-4), 324-329.  
  DOI 10.1016/0304-3991(89)90318-5
  
  01-04-1989
• Radiation effects
  Humphreys CJ
  Ultramicroscopy, Elsevier Bv vol. 28 (1-4), 357-358.  
  DOI 10.1016/0304-3991(89)90325-2
  
  01-04-1989
• Compositional modulations in GexSi1−x heteroepitaxial layers
  Fraser HL, Maher DM, Knoell RV, Eaglesham DJ, Humphreys CJ, Bean JC
  Journal of Vacuum Science &Amp; Technology B: Microelectronics Processing and Phenomena, American Vacuum Society vol. 7 (2), 210-213.  
  DOI 10.1116/1.584718
  
  01-03-1989
• Tetragonal and monoclinic forms of GexSi1−x epitaxial layers
  Eaglesham DJ, Maher DM, Fraser HL, Humphreys CJ, Bean JC
  Applied Physics Letters, Aip Publishing vol. 54 (3), 222-224.  
  DOI 10.1063/1.101015
  
  16-01-1989
• New Source of Dislocations inGexSi1−x/Si(
  Eaglesham DJ, Maher DM, Kvam EP, Bean JC, Humphreys CJ
  Physical Review Letters, American Physical Society (Aps) vol. 62 (2), 187-190.  
  DOI 10.1103/physrevlett.62.187
  
  09-01-1989
• Dislocation Behaviour in Ge_xSi_1-x Epilayers on (001)Si
  Kvam EP, Maher DM, Humphreys CJ
  Mrs Proceedings, Springer Science and Business Media Llc vol. 160 
  DOI 10.1557/proc-160-71
  
  01-01-1989
• Electron Beam Induced Nanometre Hole Formation and Surface Modification in Al, Si And MgO
  Bullough TJ, Humphreys CJ, Devenish RW
  Mrs Proceedings, Springer Science and Business Media Llc vol. 157 
  DOI 10.1557/proc-157-323
  
  01-01-1989
• Materials science and engineering in Britain
  Humphreys C
  Advanced Materials, Wiley vol. 1 (8-9), 249-250.  
  DOI 10.1002/adma.19890010802
  
  01-01-1989

1988

• High temperature superconducting ceramics
  Eaglesham DJ, Humphreys CJ, Alford NM, Clegg WJ, Harmer MA, Birchall JD
  Materials Science and Engineering: B, Elsevier Bv vol. 1 (3-4), 229-235.  
  DOI 10.1016/0921-5107(88)90003-7
  
  01-12-1988
• X-ray topography of the coherency breakdown in GexSi1−x/Si(100)
  Eaglesham DJ, Kvam EP, Maher DM, Humphreys CJ, Green GS, Tanner BK, Bean JC
  Applied Physics Letters, Aip Publishing vol. 53 (21), 2083-2085.  
  DOI 10.1063/1.100288
  
  21-11-1988
• Convergent-beam imaging—a transmission electron microscopy technique for investigating small localized distortions in crystals
  Humphreys CJ, Maher DM, Fraser HL, Eaglesham DJ
  Philosophical Magazine A, Informa Uk Limited vol. 58 (5), 787-798.  
  DOI 10.1080/01418618808209953
  
  01-11-1988
• ChemInform Abstract: Silica‐Supported Fe‐Pd Bimetallic Particles ‐ Formation from Mixed‐Metal Clusters and Catalytic Activity.
  BRAUNSTEIN P, DEVENISH R, GALLEZOT P, HEATON BT, HUMPHREYS CJ, KERVENNAL J, MULLEY S, RIES M
  Cheminform, Wiley vol. 19 (42) 
  DOI 10.1002/chin.198842090
  
  18-10-1988
• PLASMA ANODISATION OF SILICON FOR ADVANCED VLSI
  TAYLOR S, ECCLESTON W, RINGNALDA J, MAHER DM, EAGLESHAM DJ, HUMPHREYS CJ, GODFREY DJ
  Le Journal De Physique Colloques, Edp Sciences vol. 49 (C4) 
  DOI 10.1051/jphyscol:1988482
  
  01-09-1988
• Fe‐Pd‐Bimetallpartikel auf SiO₂‐Trägern – Bildung aus Heterometallclustern und katalytische Aktivität
  Braunstein P, Devenish R, Gallezot P, Heaton BT, Humphreys CJ, Kervennal J, Mulley S, Ries M
  Angewandte Chemie, Wiley vol. 100 (7), 972-973.  
  DOI 10.1002/ange.19881000720
  
  01-07-1988
• Silica‐Supported FePd Bimetallic Particles: Formation from Mixed‐Metal Clusters and Catalytic Activity
  Braunstein P, Devenish R, Gallezot P, Heaton BT, Humphreys CJ, Kervennal J, Mulley S, Ries M
  Angewandte Chemie International Edition in English, Wiley vol. 27 (7), 927-929.  
  DOI 10.1002/anie.198809271
  
  01-07-1988
• CBED and CBIM from semiconductors and superconductors
  Humphreys CJ, Eaglesham DJ, Maher DM, Fraser HL
  Ultramicroscopy, Elsevier Bv vol. 26 (1-2), 13-23.  
  DOI 10.1016/0304-3991(88)90371-3
  
  01-01-1988
• Dislocation Nucleation in GeSi/Si(100) Strained Epilayers
  Eaglesham DJ, Kvam EP, Maher DM, Humphreys CJ, Bean JC
  Mrs Proceedings, Springer Science and Business Media Llc vol. 138 
  DOI 10.1557/proc-138-397
  
  01-01-1988
• Erratum: Limits on quantitative information from high-resolution electron microscopy of YBa2Cu3O7superconductors
  Huxford NP, Eaglesham DJ, Humphreys CJ
  Nature, Springer Science and Business Media Llc vol. 331 (6153), 286-286.  
  DOI 10.1038/331286b0
  
  01-01-1988

1987

• Limits on quantitative information from high-resolution electron microscopy of YBa2Cu3O7 superconductors
  Huxford NP, Eaglesham DJ, Humphreys CJ
  Nature, Springer Science and Business Media Llc vol. 329 (6142), 812-813.  
  DOI 10.1038/329812a0
  
  01-10-1987
• New phases in the superconducting Y:Ba:Cu:O system
  Eaglesham DJ, Humphreys CJ, Alford NM, Clegg WJ, Harmer MA, Birchall JD
  Applied Physics Letters, Aip Publishing vol. 51 (6), 457-459.  
  DOI 10.1063/1.98421
  
  10-08-1987
• THE ORTHORHOMBIC AND TETRAGONAL PHASES OF Y₁Ba₂Cu₃O_9-y
  Eaglesham DJ, Humphreys CJ, Clegg WJ, Harmer MA, AIford NM, Birchall JD
  Advanced Ceramic Materials, Wiley vol. 2 (3B), 662-667.  
  DOI 10.1111/j.1551-2916.1987.tb00132.x
  
  01-07-1987
• Erratum: White lines in theL2,3electron-energy-loss and x-ray absorption spectra of 3dtransition metals [Phys. Rev. B34, 1467 (1986)]
  Waddington WG, Rez P, Grant IP, Humphreys CJ
  Physical Review B, American Physical Society (Aps) vol. 35 (10), 5297-5297.  
  DOI 10.1103/physrevb.35.5297
  
  01-04-1987
• Detection and measurement of local distortions in a semiconductor layered structure by convergent-beam electron diffraction
  Maher DM, Fraser HL, Humphreys CJ, Knoell RV, Bean JC
  Applied Physics Letters, Aip Publishing vol. 50 (10), 574-576.  
  DOI 10.1063/1.98139
  
  09-03-1987
• Electron energy-loss spectroscopy studies of nanometre-scale structures in alumina produced by intense electron-beam irradiation
  Berger SD, Salisbury IG, Milne RH, Imeson D, Humphreys CJ
  Philosophical Magazine B, Informa Uk Limited vol. 55 (3), 341-358.  
  DOI 10.1080/13642818708208619
  
  01-03-1987
• Analytical electron microscopy of [Ni38Pt6(CO)48H]5?
  Heaton BT, Ingallina P, Devenish R, Humphreys CJ, Ceriotti A, Longoni G, Marchionna M
  Journal of The Chemical Society, Chemical Communications, Royal Society of Chemistry (Rsc) (10), 765-765.  
  DOI 10.1039/c39870000765
  
  01-01-1987
• The Nucleation and Propagation of Misfit Dislocations aear the Critical Thickness in Ge-Si Strained Epilayers
  Kvam EP, Eaglesham DJ, Maher DM, Humphreys CJ, Bean JC, Green GS, Tanner BK
  Mrs Proceedings, Springer Science and Business Media Llc vol. 104 
  DOI 10.1557/proc-104-623
  
  01-01-1987

1986

• STEM/EDX MICOANALYSIS OF COMPOSITIONAL FLUCTUATIONS IN SEMICONDUCTOR MULTI-QUANTUM-WELL STRUCTURES.
  Bullock JF, Titchmarsh JM, Humphreys CJ
  Semiconductor Science and Technology vol. 1 (6), 342-345.  
  01-12-1986
• STEM/EDX microanalysis of compositional fluctuations in semiconductor multi-quantum-well structures
  Bullock JF, Titchmarsh JM, Humphreys CJ
  Semiconductor Science and Technology, IOP Publishing vol. 1 (6), 343-345.  
  DOI 10.1088/0268-1242/1/6/001
  
  01-12-1986
• White lines in theL2,3electron-energy-loss and x-ray absorption spectra of3dtransition metals
  Waddington WG, Rez P, Grant IP, Humphreys CJ
  Physical Review B, American Physical Society (Aps) vol. 34 (3), 1467-1473.  
  DOI 10.1103/physrevb.34.1467
  
  01-08-1986
• Electron-beam damage observed in the fast proton conductor ammonium/hydronium β''-alumina: a high-resolution electron microscope (HREM) study
  Petford AK, Humphreys CJ
  Acta Crystallographica Section B Structural Science, International Union of Crystallography (Iucr) vol. 42 (3), 224-229.  
  DOI 10.1107/s0108768186098300
  
  01-06-1986
• Compositional Studies of Semiconductor Alloys by Bright Field Electron Microscope Imaging of Wedged Crystals
  Eaglesham DJ, Hetherington CJD, Humphreys CJ
  Mrs Proceedings, Springer Science and Business Media Llc vol. 77 
  DOI 10.1557/proc-77-473
  
  01-01-1986

1985

• Geometric and electronic structure of a semiconductor superlattice
  Davies RA, Kelly MJ, Kerr TM, Hetherington CJD, Humphreys CJ
  Nature, Springer Science and Business Media Llc vol. 317 (6036), 418-419.  
  DOI 10.1038/317418a0
  
  01-10-1985
• Surface physics: Hopping atoms in crystal growth
  Humphreys CJ
  Nature, Springer Science and Business Media Llc vol. 317 (6032), 16-16.  
  DOI 10.1038/317016a0
  
  01-09-1985
• Structure of the Al/Al2O3 interface
  Timsit RS, Waddington WG, Humphreys CJ, Hutchison JL
  Applied Physics Letters, Aip Publishing vol. 46 (9), 830-832.  
  DOI 10.1063/1.95899
  
  01-05-1985
• Examination of the Al/Al2O3 interface by high-resolution electron microscopy
  Timsit RS, Waddington WG, Humphreys CJ, Hutchison JL
  Ultramicroscopy, Elsevier Bv vol. 18 (1-4), 387-394.  
  DOI 10.1016/0304-3991(85)90157-3
  
  01-01-1985

1984

• Nanometer scale electron beam lithography in inorganic materials
  Salisbury IG, Timsit RS, Berger SD, Humphreys CJ
  Applied Physics Letters, Aip Publishing vol. 45 (12), 1289-1291.  
  DOI 10.1063/1.95115
  
  15-12-1984
• MICRO-84: Electron microscopy 50 years on
  Humphreys CJ
  Nature, Springer Science and Business Media Llc vol. 311 (5981), 12-12.  
  DOI 10.1038/311012a0
  
  06-09-1984
• The atomic structure of the NiSi₂-(001)Si interface
  Cherns D, Hetherington CJD, Humphreys CJ
  Philosophical Magazine A, Informa Uk Limited vol. 49 (1), 165-177.  
  DOI 10.1080/01418618408233436
  
  01-07-1984
• Crytallography: Defects in reduced oxides
  Humphreys CJ
  Nature, Springer Science and Business Media Llc vol. 309 (5966), 310-310.  
  DOI 10.1038/309310a0
  
  24-05-1984
• CHANNELLING RADIATION IN ELECTRON MICROSCOPY.
  Spence JCH, Humphreys CJ
  Optik Jena vol. 66 (3), 225-242.  
  01-01-1984
• The energy dependence of axial coherent bremsstrahlung at low accelerating voltages
  Butler JH, Spence JCH, Reese G, Humphreys CJ, Doole RC
  Radiation Effects, Informa Uk Limited vol. 84 (3-4), 245-256.  
  DOI 10.1080/00337578508224061
  
  01-01-1984

1983

• Dating the Crucifixion
  Humphreys CJ, Waddington WG
  Nature, Springer Science and Business Media Llc vol. 306 (5945), 743-746.  
  DOI 10.1038/306743a0
  
  01-12-1983

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