Prof Sir Colin Humphreys
CBE, FREng, FRS, BSc, MA, PhD, Hon DSc, FIMMM, FInstP, FCGI, Hon FRMS

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Page 9 of 10

1992

• ULTIMATE LIMITS OF LITHOGRAPHY
  MORGAN C, CHEN GS, BOOTHROYD C, BAILEY S, HUMPHREYS C
  Physics World vol. 5 (11), 28-32.  
  01-01-1992

1991

• State of British science
  HUMPHREYS C
  Nature, Springer Nature vol. 351 (6327), 513-513.  
  DOI 10.1038/351513a0
  
  13-06-1991
• The origin of dislocations in multilayers
  Humphreys CJ, Maher DM, Eaglesham DJ, Kvam EP, Salisbury IG
  Journal De Physique III, Edp Sciences vol. 1 (6), 1119-1130.  
  DOI 10.1051/jp3:1991175
  
  01-06-1991
• 100 keV electron beam damage of metals and oxides
  Humphreys C
  Micron, Elsevier vol. 22 (1-2), 147-148.  
  DOI 10.1016/0739-6260(91)90133-k
  
  01-01-1991
• THE STAR OF BETHLEHEM - A COMET IN 5 BC - AND THE DATE OF THE BIRTH OF CHRIST
  HUMPHREYS CJ
  Quarterly Journal of The Royal Astronomical Society vol. 32 (4), 389-407.  
  01-01-1991

1990

• Crucifixion date
  HUMPHREYS C, WADDINGTON WG
  Nature, Springer Nature vol. 348 (6303), 684-684.  
  DOI 10.1038/348684a0
  
  27-12-1990
• Variation of dislocation morphology with strain in GexSi1−x epilayers on (100)Si
  Kvam EP, Maher DM, Humphreys CJ
  Journal of Materials Research, Springer Nature vol. 5 (9), 1900-1907.  
  DOI 10.1557/jmr.1990.1900
  
  01-09-1990
• The interaction of electron beams with solids - Some new effects
  Humphreys CJ, Bullough TJ, Devenish RW, Maher DM, Turner PS
  Microscopy and Microanalysis, Cambridge University Press (Cup) vol. 48 (4), 788-789.  
  DOI 10.1017/s0424820100177076
  
  01-08-1990
• Nanometre hole formation in MgO using electron beams
  Turner PS, Bullough TJ, Devenish RW, Maher DM, Humphreys CJ
  Philosophical Magazine Letters, Taylor & Francis vol. 61 (4), 181-193.  
  DOI 10.1080/09500839008202357
  
  01-04-1990
• On the microstructural evolution of sintered Bi-Sr-Ca-Cu-O high-Tc superconductors
  Zhang JG, McCartney DG, Humphreys CJ
  Superconductor Science and Technology, IOP Publishing vol. 3 (4) 
  DOI 10.1088/0953-2048/3/4/006
  
  01-04-1990

1989

• Book Review: Transmission Electron Microscopy. By L. Reimer
  Humphreys CJ
  Angewandte Chemie International Edition, Wiley vol. 28 (12), 1763-1764.  
  DOI 10.1002/anie.198917631
  
  01-12-1989
• Dislocation Behaviour in GexSi1-x Epilayers on (001)Si
  Kvam EP, Maher DM, Humphreys CJ
  Mrs Online Proceedings Library, Springer Nature vol. 160 (1), 71-76.  
  DOI 10.1557/proc-160-71
  
  01-12-1989
• Electron Beam Induced Nanometre Hole Formation and Surface Modification in Al, Si And MgO
  Bullough TJ, Humphreys CJ, Devenish RW
  Mrs Online Proceedings Library, Springer Nature vol. 157 (1), 323-328.  
  DOI 10.1557/proc-157-323
  
  01-12-1989
• Transmission Electron Microscopy. By L. Reimer. Springer Series in Optical Sciences, Springer‐Verlag, Second Edition, 1989, xiii, 547 pp., paperback, DM 128. – ISBN 3‐540‐50499‐0
  Humphreys CJ
  Angewandte Chemie, Wiley vol. 101 (12), 1803-1804.  
  DOI 10.1002/ange.19891011265
  
  01-12-1989
• Controlling crystal growth
  Humphreys C
  Nature, Springer Nature vol. 341 (6244), 689-689.  
  DOI 10.1038/341689a0
  
  26-10-1989
• Materials Science and Engineering in Britain
  Humphreys C
  Angewandte Chemie International Edition, Wiley vol. 28 (8), 1077-1078.  
  DOI 10.1002/anie.198910771
  
  01-08-1989
• Dislocation nucleation near the critical thickness in GeSi/Si strained layers
  Eaglesham DJ, Kvam EP, Maher DM, Humphreys CJ, Bean JC
  The Philosophical Magazine a Journal of Theoretical Experimental and Applied Physics, Taylor & Francis vol. 59 (5), 1059-1073.  
  DOI 10.1080/01418618908209837
  
  01-05-1989
• Nanolithography using field emission and conventional thermionic electron sources
  Devenish RW, Eaglesham DJ, Maher DM, Humphreys CJ
  Ultramicroscopy, Elsevier vol. 28 (1-4), 324-329.  
  DOI 10.1016/0304-3991(89)90318-5
  
  01-04-1989
• Radiation effects
  Humphreys CJ
  Ultramicroscopy, Elsevier vol. 28 (1-4), 357-358.  
  DOI 10.1016/0304-3991(89)90325-2
  
  01-04-1989
• Compositional modulations in Ge x Si1− x heteroepitaxial layers
  Fraser HL, Maher DM, Knoell RV, Eaglesham DJ, Humphreys CJ, Bean JC
  Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, American Vacuum Society vol. 7 (2), 210-213.  
  DOI 10.1116/1.584718
  
  01-03-1989
• Tetragonal and monoclinic forms of Ge x Si1− x epitaxial layers
  Eaglesham DJ, Maher DM, Fraser HL, Humphreys CJ, Bean JC
  Applied Physics Letters, Aip Publishing vol. 54 (3), 222-224.  
  DOI 10.1063/1.101015
  
  16-01-1989
• New Source of Dislocations in GexSi1-x/Si(100) Strained Epitaxial Layers
  Eaglesham DJ, Maher DM, Kvam EP, Bean JC, Humphreys CJ
  Physical Review Letters, American Physical Society (Aps) vol. 62 (2), 187-190.  
  DOI 10.1103/physrevlett.62.187
  
  09-01-1989
• Materials science and engineering in Britain
  Humphreys C
  Advanced Materials, Wiley vol. 1 (8‐9), 249-250.  
  DOI 10.1002/adma.19890010802
  
  01-01-1989
• Transmission electron microscopy. By L. Reimer. Springer Series in Optical Sciences, Springer‐Verlag, Second Edition, 1989, xiii, 547 pp., paperback, DM 128. ‐ISBN 3‐540‐50499‐0
  Humphreys CJ
  Advanced Materials, Wiley vol. 1 (12), 463-464.  
  DOI 10.1002/adma.19890011217
  
  01-01-1989

1988

• Dislocation Nucleation in GeSi/Si(100) Strained Epilayers
  Eaglesham DJ, Kvam EP, Maher DM, Humphreys CJ, Bean JC
  Mrs Online Proceedings Library, Springer Nature vol. 138 (1), 397-402.  
  DOI 10.1557/proc-138-397
  
  01-12-1988
• High temperature superconducting ceramics
  Eaglesham DJ, Humphreys CJ, Alford NM, Clegg WJ, Harmer MA, Birchall JD
  Materials Science and Engineering B, Elsevier vol. 1 (3-4), 229-235.  
  DOI 10.1016/0921-5107(88)90003-7
  
  01-12-1988
• X-ray topography of the coherency breakdown in Ge x Si1− x /Si(100)
  Eaglesham DJ, Kvam EP, Maher DM, Humphreys CJ, Green GS, Tanner BK, Bean JC
  Applied Physics Letters, Aip Publishing vol. 53 (21), 2083-2085.  
  DOI 10.1063/1.100288
  
  21-11-1988
• Convergent-beam imaging—a transmission electron microscopy technique for investigating small localized distortions in crystals
  Humphreys CJ, Maher DM, Fraser HL, Eaglesham DJ
  The Philosophical Magazine a Journal of Theoretical Experimental and Applied Physics, Taylor & Francis vol. 58 (5), 787-798.  
  DOI 10.1080/01418618808209953
  
  01-11-1988
• ChemInform Abstract: Silica‐Supported Fe‐Pd Bimetallic Particles ‐ Formation from Mixed‐Metal Clusters and Catalytic Activity.
  BRAUNSTEIN P, DEVENISH R, GALLEZOT P, HEATON BT, HUMPHREYS CJ, KERVENNAL J, MULLEY S, RIES M
  Cheminform, Wiley vol. 19 (42), no-no.  
  DOI 10.1002/chin.198842090
  
  18-10-1988
• Plasma Anodisation of Silicon for Advanced VLSI
  Taylor S, Eccleston W, Ringnalda J, Maher DM, Eaglesham DJ, Humphreys CJ, Godfrey DJ
  Journal De Physique Archives, Edp Sciences vol. 49 (C4) 
  DOI 10.1051/jphyscol:1988482
  
  01-09-1988
• Fe‐Pd‐Bimetallpartikel auf SiO2‐Trägern – Bildung aus Heterometallclustern und katalytische Aktivität
  Braunstein P, Devenish R, Gallezot P, Heaton BT, Humphreys CJ, Kervennal J, Mulley S, Ries M
  Angewandte Chemie, Wiley vol. 100 (7), 972-973.  
  DOI 10.1002/ange.19881000720
  
  01-07-1988
• Silica‐Supported FePd Bimetallic Particles: Formation from Mixed‐Metal Clusters and Catalytic Activity
  Braunstein P, Devenish R, Gallezot P, Heaton BT, Humphreys CJ, Kervennal J, Mulley S, Ries M
  Angewandte Chemie International Edition, Wiley vol. 27 (7), 927-929.  
  DOI 10.1002/anie.198809271
  
  01-07-1988
• CBED and CBIM from semiconductors and superconductors
  Humphreys CJ, Eaglesham DJ, Maher DM, Fraser HL
  Ultramicroscopy, Elsevier vol. 26 (1-2), 13-23.  
  DOI 10.1016/0304-3991(88)90371-3
  
  01-01-1988
• Erratum: Limits on quantitative information from high-resolution electron microscopy of YBa2Cu3O7superconductors
  Huxford NP, Eaglesham DJ, Humphreys CJ
  Nature, Springer Nature vol. 331 (6153), 286-286.  
  DOI 10.1038/331286b0
  
  01-01-1988

1987

• The Nucleation and Propagation of Misfit Dislocations near the Critical Thickness in Ge-Si Strained Epilayers
  Kvam EP, Eaglesham DJ, Maher DM, Humphreys CJ, Bean JC, Green GS, Tanner BK
  Mrs Online Proceedings Library, Springer Nature vol. 104 (1), 623-628.  
  DOI 10.1557/proc-104-623
  
  01-12-1987
• Limits on quantitative information from high-resolution electron microscopy of YBa2Cu3O7 superconductors
  Huxford NP, Eaglesham DJ, Humphreys CJ
  Nature, Springer Nature vol. 329 (6142), 812-813.  
  DOI 10.1038/329812a0
  
  01-10-1987
• Exploiting dynamical high-energy electron diffraction effects
  Humphreys CJ, Eaglesham DJ
  Acta Crystallographica Section a: Foundations and Advances, International Union of Crystallography (Iucr) vol. 43 (a1), c247-c247.  
  DOI 10.1107/s0108767387078851
  
  12-08-1987
• New phases in the superconducting Y:Ba:Cu:O system
  Eaglesham DJ, Humphreys CJ, Alford NM, Clegg WJ, Harmer MA, Birchall JD
  Applied Physics Letters, Aip Publishing vol. 51 (6), 457-459.  
  DOI 10.1063/1.98421
  
  10-08-1987
• The energy dependence of axial coherent bremsstrahlung in the high-voltage electron microscope
  Butler JH, Spence JCH, Humphreys CJ, Johnson EA
  Microscopy and Microanalysis, Cambridge University Press (Cup) vol. 45, 110-111.  
  DOI 10.1017/s0424820100125488
  
  01-08-1987
• THE ORTHORHOMBIC AND TETRAGONAL PHASES OF Y 1 Ba 2 Cu 3 O 9-y
  Eaglesham DJ, Humphreys CJ, Clegg WJ, Harmer MA, AIford NM, Birchall JD
  Advanced Ceramic Materials, Wiley vol. 2 (3B), 662-667.  
  DOI 10.1111/j.1551-2916.1987.tb00132.x
  
  01-07-1987
• Erratum: White lines in the L2,3 electron-energy-loss and x-ray absorption spectra of 3d transition metals [Phys. Rev. B 34, 1467 (1986)]
  Waddington W, Rez P, Grant I, Humphreys C
  Physical Review B, American Physical Society (Aps) vol. 35 (10), 5297-5297.  
  DOI 10.1103/physrevb.35.5297
  
  01-04-1987
• Detection and measurement of local distortions in a semiconductor layered structure by convergent-beam electron diffraction
  Maher DM, Fraser HL, Humphreys CJ, Knoell RV, Bean JC
  Applied Physics Letters, Aip Publishing vol. 50 (10), 574-576.  
  DOI 10.1063/1.98139
  
  09-03-1987
• Electron energy-loss spectroscopy studies of nanometre-scale structures in alumina produced by intense electron-beam irradiation
  Berger SD, Salisbury IG, Milne RH, Imeson D, Humphreys CJ
  Philosophical Magazine B, Taylor & Francis vol. 55 (3), 341-358.  
  DOI 10.1080/13642818708208619
  
  01-03-1987
• Analytical electron microscopy of [Ni 38 Pt 6 (CO) 48 H] 5–
  Heaton BT, Ingallina P, Devenish R, Humphreys CJ, Ceriotti A, Longoni G, Marchionna M
  Chemical Communications, Royal Society of Chemistry (Rsc) (10), 765-766.  
  DOI 10.1039/c39870000765
  
  01-01-1987

1986

• Compositional Studies of Semiconductor Alloys by Bright Field Electron Microscope Imaging of Wedged Crystals
  Eaglesham DJ, Hetherington CJD, Humphreys CJ
  Mrs Online Proceedings Library, Springer Nature vol. 77 (1), 473-478.  
  DOI 10.1557/proc-77-473
  
  01-12-1986
• STEM/EDX MICOANALYSIS OF COMPOSITIONAL FLUCTUATIONS IN SEMICONDUCTOR MULTI-QUANTUM-WELL STRUCTURES.
  Bullock JF, Titchmarsh JM, Humphreys CJ
  Semiconductor Science and Technology vol. 1 (6), 342-345.  
  01-12-1986
• STEM/EDX microanalysis of compositional fluctuations in semiconductor multi-quantum-well structures
  Bullock JF, Titchmarsh JM, Humphreys CJ
  Semiconductor Science and Technology, IOP Publishing vol. 1 (6) 
  DOI 10.1088/0268-1242/1/6/001
  
  01-12-1986
• White lines in the L2,3 electron-energy-loss and x-ray absorption spectra of 3d transition metals
  Waddington WG, Rez P, Grant IP, Humphreys CJ
  Physical Review B, American Physical Society (Aps) vol. 34 (3), 1467-1473.  
  DOI 10.1103/physrevb.34.1467
  
  01-08-1986
• Electron‐beam damage observed in the fast proton conductor ammonium/hydronium β''‐alumina: a high‐resolution electron microscope (HREM) study
  Petford AK, Humphreys CJ
  Acta Crystallographica Section B: Structural Science, Crystal Engineering and Materials, International Union of Crystallography (Iucr) vol. 42 (3), 224-229.  
  DOI 10.1107/s0108768186098300
  
  01-06-1986

1985

• Geometric and electronic structure of a semiconductor superlattice
  Davies RA, Kelly MJ, Kerr TM, Hetherington CJD, Humphreys CJ
  Nature, Springer Nature vol. 317 (6036), 418-419.  
  DOI 10.1038/317418a0
  
  01-10-1985

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