Prof Sir Colin Humphreys
CBE, FREng, FRS, BSc, MA, PhD, Hon DSc, FIMMM, FInstP, FCGI, Hon FRMS

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All Publications

Page 10 of 10

1985

• Surface physics: Hopping atoms in crystal growth
  Humphreys CJ
  Nature, Springer Nature vol. 317 (6032), 16-16.  
  DOI 10.1038/317016a0
  
  01-09-1985
• Structure of the Al/Al2O3 interface
  Timsit RS, Waddington WG, Humphreys CJ, Hutchison JL
  Applied Physics Letters, Aip Publishing vol. 46 (9), 830-832.  
  DOI 10.1063/1.95899
  
  01-05-1985
• Examination of the Al/Al2O3 interface by high-resolution electron microscopy
  Timsit RS, Waddington WG, Humphreys CJ, Hutchison JL
  Ultramicroscopy, Elsevier vol. 18 (1-4), 387-394.  
  DOI 10.1016/0304-3991(85)90157-3
  
  01-01-1985

1984

• Nanometer scale electron beam lithography in inorganic materials
  Salisbury IG, Timsit RS, Berger SD, Humphreys CJ
  Applied Physics Letters, Aip Publishing vol. 45 (12), 1289-1291.  
  DOI 10.1063/1.95115
  
  15-12-1984
• MICRO-84: Electron microscopy 50 years on
  Humphreys CJ
  Nature, Springer Nature vol. 311 (5981), 12-12.  
  DOI 10.1038/311012a0
  
  06-09-1984
• The atomic structure of the NiSi2-(001)Si interface
  Cherns D, Hetherington CJD, Humphreys CJ
  The Philosophical Magazine a Journal of Theoretical Experimental and Applied Physics, Taylor & Francis vol. 49 (1), 165-177.  
  DOI 10.1080/01418618408233436
  
  01-07-1984
• Crytallography: Defects in reduced oxides
  Humphreys CJ
  Nature, Springer Nature vol. 309 (5966), 310-310.  
  DOI 10.1038/309310a0
  
  24-05-1984
• CHANNELLING RADIATION IN ELECTRON MICROSCOPY.
  Spence JCH, Humphreys CJ
  Optik Jena vol. 66 (3), 225-242.  
  01-01-1984
• The energy dependence of axial coherent bremsstrahlung at low accelerating voltages
  Butler JH, Spence JCH, Reese G, Humphreys CJ, Doole RC
  Radiation Effects and Defects in Solids, Taylor & Francis vol. 84 (3-4), 245-256.  
  DOI 10.1080/00337578508224061
  
  01-01-1984

1983

• Dating the Crucifixion
  Humphreys CJ, Waddington WG
  Nature, Springer Nature vol. 306 (5945), 743-746.  
  DOI 10.1038/306743a0
  
  01-12-1983
• High resolution electron microscopy of silver β- and β″ -aluminas
  Hull R, Petford AK, Humphreys CJ, Smith DJ
  Solid State Ionics, Elsevier vol. 9, 181-186.  
  DOI 10.1016/0167-2738(83)90231-x
  
  01-12-1983
• Cutting of 20 Å holes and lines in metal-β-aluminas
  Mochel ME, Humphreys CJ, Mochel JM, Eades JA
  Microscopy and Microanalysis, Cambridge University Press (Cup) vol. 41, 100-101.  
  DOI 10.1017/s0424820100074379
  
  01-08-1983
• Instrumentation for detecting channelling radiation in the high-voltage electron microscope
  Butler JH, Humphreys CJ
  Microscopy and Microanalysis, Cambridge University Press (Cup) vol. 41, 318-319.  
  DOI 10.1017/s0424820100075385
  
  01-08-1983
• A high‐resolution electron microscopic study of defects in sodium β′″‐alumina
  Hull R, Smith DJ, Humphreys CJ
  Journal of Microscopy, Wiley vol. 130 (2), 203-214.  
  DOI 10.1111/j.1365-2818.1983.tb04218.x
  
  01-05-1983
• Electron beam writing on a 20-Å scale in metal β-aluminas
  Mochel ME, Humphreys CJ, Eades JA, Mochel JM, Petford AM
  Applied Physics Letters, Aip Publishing vol. 42 (4), 392-394.  
  DOI 10.1063/1.93918
  
  15-02-1983

1981

• Fundamental concepts of stem imaging
  Humphreys CJ
  Ultramicroscopy, Elsevier vol. 7 (1) 
  DOI 10.1016/0304-3991(81)90028-0
  
  01-01-1981
• RESOLUTION AND ILLUMINATION COHERENCE IN ELECTRON MICROSCOPY.
  Humphreys CJ, Spence JCH
  Optik Jena vol. 58 (2), 125-142.  
  01-01-1981

1980

• A multiple scattering transport theory for electron
  Spencer JP, Humphreys CJ
  The Philosophical Magazine a Journal of Theoretical Experimental and Applied Physics, Taylor & Francis vol. 42 (4), 433-451.  
  DOI 10.1080/01418618008239368
  
  01-10-1980
• The critical‐voltage effect in convergent‐beam high‐voltage electron diffraction
  Sellar JR, Imeson D, Humphreys CJ
  Acta Crystallographica Section a: Foundations and Advances, International Union of Crystallography (Iucr) vol. 36 (4), 686-696.  
  DOI 10.1107/s0567739480001398
  
  01-07-1980
• The combined convergent beam/critical voltage technique in high voltage electron microscopy
  Sellar JR, Imeson D, Humphreys CJ
  Micron (1969), Elsevier vol. 11 (3-4), 241-242.  
  DOI 10.1016/0047-7206(80)90004-7
  
  01-01-1980

1979

• The scattering of fast electrons by crystals
  Humphreys CJ
  Reports On Progress in Physics, IOP Publishing vol. 42 (11) 
  DOI 10.1088/0034-4885/42/11/002
  
  01-11-1979
• A theoretical study of temperature distributions during Czochralski crystal growth
  Buckley-golder IM, Humphreys CJ
  The Philosophical Magazine a Journal of Theoretical Experimental and Applied Physics, Taylor & Francis vol. 39 (1), 41-57.  
  DOI 10.1080/01418617908239274
  
  01-01-1979

1978

• A new dissociation mode for dislocations in silicon
  Ourmazd A, Booker GR, Humphreys CJ
  Microscopy and Microanalysis, Cambridge University Press (Cup) vol. 36 (1), 346-347.  
  DOI 10.1017/s0424820100108878
  
  01-01-1978

1977

• Additional image peaks in the high resolution imaging of dislocations
  Humphreys CJ, Drummond RA, Hart-davis A, Butler EP
  The London Edinburgh and Dublin Philosophical Magazine and Journal of Science, Taylor & Francis vol. 35 (6), 1543-1555.  
  DOI 10.1080/14786437708232977
  
  01-06-1977
• Dynamical Aspects of Electron Diffraction
  Humphreys CJ
  Microscopy and Microanalysis, Cambridge University Press (Cup) vol. 35, 26-29.  
  DOI 10.1017/s0424820100077773
  
  01-01-1977
• The distribution of intensity in electron diffraction patterns due to phonon scattering
  Rez P, Humphreys CJ, Whelan MJ
  The London Edinburgh and Dublin Philosophical Magazine and Journal of Science, Taylor & Francis vol. 35 (1), 81-96.  
  DOI 10.1080/14786437708235974
  
  01-01-1977

1974

• A theoretical model for the energy dependence of electron channelling patterns in scanning electron microscopy
  Sandström R, Spencer JF, Humphreys CJ
  Journal of Physics D, IOP Publishing vol. 7 (7) 
  DOI 10.1088/0022-3727/7/7/310
  
  01-05-1974
• Recent applications of high voltage electron microscopy in various branches of science
  Humphreys CJ
  Microscope vol. 22 (2), 129-140.  
  01-01-1974

1973

• SCANNING ELECTRON MICROSCOPY/1972. PROC I: 5TH ANNUAL SCANNING ELECTRON MICROSCOPE SYMPOSIUM, APR 1972; II: WORKSHOP ON BIOLOGICAL SPECIMEN PREPARATION FOR SCANNING ELECTRON MICROSCOPY, APR 1972.
  Humphreys CJ, Spencer JP, Woolf RJ, Joy DC, Titchmarsh JM, Booker GR, Strojnik A, STickler R et al.
   
  01-01-1973

1972

• A dynamical theory for the contrast of perfect and imperfect crystals in the scanning electron microscope using backscattered electrons
  Spencer JP, Humphreys CJ, Hirsch PB
  The London Edinburgh and Dublin Philosophical Magazine and Journal of Science, Taylor & Francis vol. 26 (1), 193-213.  
  DOI 10.1080/14786437208221029
  
  01-07-1972
• The optimum voltage in very high voltage electron microscopy
  Humphreys CJ
  The London Edinburgh and Dublin Philosophical Magazine and Journal of Science, Taylor & Francis vol. 25 (6), 1459-1472.  
  DOI 10.1080/14786437208223865
  
  01-06-1972
• The critical voltage effect in high voltage electron microscopy
  Lally JS, Humphreys CJ, Metherell AJF, Fisher RM
  The London Edinburgh and Dublin Philosophical Magazine and Journal of Science, Taylor & Francis vol. 25 (2), 321-343.  
  DOI 10.1080/14786437208226808
  
  01-02-1972

1971

• Bloch wave notation in many-beam electron diffraction theory
  Humphreys CJ, Fisher RM
  Acta Crystallographica Section a: Foundations and Advances, International Union of Crystallography (Iucr) vol. 27 (1), 42-45.  
  DOI 10.1107/s0567739471000081
  
  01-01-1971
• Maximizing the penetration in high voltage electron microscopy
  Humphreys CJ, Thomas LE, Lally JS, Fisher RM
  The London Edinburgh and Dublin Philosophical Magazine and Journal of Science, Taylor & Francis vol. 23 (181), 87-114.  
  DOI 10.1080/14786437108216366
  
  01-01-1971

1970

• Kikuchi patterns in a high voltage electron microscope
  Thomas LE, Humphreys CJ
  Physica Status Solidi (a) – Applications and Materials Science, Wiley vol. 3 (3), 599-615.  
  DOI 10.1002/pssa.19700030306
  
  16-11-1970
• High resolution divergent-beam X-ray topography
  Tanner BK, Humphreys CJ
  Journal of Physics D, IOP Publishing vol. 3 (7) 
  DOI 10.1088/0022-3727/3/7/421
  
  01-07-1970
• Aspects of Bloch-Wave Channeling in High-Voltage Electron Microscopy
  Humphreys CJ, Lally JS
  Journal of Applied Physics, Aip Publishing vol. 41 (1), 232-235.  
  DOI 10.1063/1.1658326
  
  01-01-1970
• Radiation damage of polymers in the million volt electron microscope
  Thomas LE, Humphreys CJ, Duff WR, Grubb DT
  Radiation Effects and Defects in Solids, Taylor & Francis vol. 3 (1), 89-91.  
  DOI 10.1080/00337577008235620
  
  01-01-1970

1969

• Inelastic scattering of fast electrons by crystals
  Humphreys CJ, Whelan MJ
  The London Edinburgh and Dublin Philosophical Magazine and Journal of Science, Taylor & Francis vol. 20 (163), 165-172.  
  DOI 10.1080/14786436908228543
  
  01-07-1969

1968

• Absorption parameters in electron diffraction theory
  Humphreys CJ, Hirsch PB
  The London Edinburgh and Dublin Philosophical Magazine and Journal of Science, Taylor & Francis vol. 18 (151), 115-122.  
  DOI 10.1080/14786436808227313
  
  01-07-1968

1967

• Some electron diffraction contrast effects at planar defects in crystals
  Humphreys CJ, Howie A, Booker GR
  The London Edinburgh and Dublin Philosophical Magazine and Journal of Science, Taylor & Francis vol. 15 (135), 507-522.  
  DOI 10.1080/14786436708220898
  
  01-03-1967

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