Prof Sir Colin Humphreys
CBE, FREng, FRS, BSc, MA, PhD, Hon DSc, FIMMM, FInstP, FCGI, Hon FRMS

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All Publications

Page 8 of 10

1998

• The Number of People in the Exodus from Egypt: Decoding Mathematically the Very Large Numbers in Numbers I and XXVI
  Humphreys C
  Vetus Testamentum, Walter De Gruyter Gmbh vol. 48 (2), 196-213.  
  DOI 10.1163/1568533982721550
  
  01-01-1998

1997

• Investigation of the proximity effect in amorphous AlF3 electron-beam resists
  Chen GS, Humphreys CJ
  Journal of Vacuum Science &Amp; Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, American Vacuum Society vol. 15 (6), 1954-1960.  
  DOI 10.1116/1.589584
  
  01-11-1997
• Book Review: The Economic Laws of Scientific Research, Terence Kealey. Macmillan Press, Basingstoke and London, 1996. £47.50 (hardback). 0-333-56045-0
  Humphreys C
  European Review, Cambridge University Press (Cup) vol. 5 (4), 443-445.  
  DOI 10.1002/(sici)1234-981x(199710)5:4<443::aid-euro204>3.0.co;2-1
  
  01-10-1997
• Observation of vertical and lateral Ge segregation in thin undulating SiGe layers on Si by electron energy-loss spectroscopy
  Walther T, Humphreys CJ, Cullis AG
  Applied Physics Letters, Aip Publishing vol. 71 (6), 809-811.  
  DOI 10.1063/1.119653
  
  11-08-1997
• Analysis of EELS near edge structures to study the bonding character in intermetallic alloys
  Botton GA, Humphreys CJ
  Micron, Elsevier Bv vol. 28 (4), 313-319.  
  DOI 10.1016/s0968-4328(97)00018-8
  
  01-08-1997
• Interfaces and Defects in Opto-Electronic Semiconductor Films Studied by Atomic Resolution STEM
  Xin Y, Wallis DJ, Browning ND, Sivananthan S, Pennycook SJ, Humphreys CJ
  Microscopy and Microanalysis, Oxford University Press (Oup) vol. 3 (S2), 461-462.  
  DOI 10.1017/s1431927600009193
  
  01-08-1997
• Characterization of Ultrathin Doping Layers in Semiconductors
  Liu CP, Dunin-Borkowski RE, Boothroyd CB, Brown PD, Humphreys CJ
  Microscopy and Microanalysis, Oxford University Press (Oup) vol. 3 (4), 352-363.  
  DOI 10.1017/s1431927697970276
  
  01-07-1997
• Microstructural and electron spectroscopic characterization of carbon nanostructures and nanotubes produced using multimetal catalysts
  Botton GA, Burnell G, Humphreys CJ, Yadav T, Withers JC
  Journal of Physics and Chemistry of Solids, Elsevier Bv vol. 58 (7), 1091-1102.  
  DOI 10.1016/s0022-3697(97)00233-3
  
  01-07-1997
• Determining directly from experiment the magnitude of the Burgers vector of glissile c-component dislocations in Ti Al
  Wiezorek JMK, Humphreys CJ, Fraser HL
  Philosophical Magazine Letters, Informa Uk Limited vol. 75 (5), 281-290.  
  DOI 10.1080/095008397179534
  
  01-05-1997
• Domain boundaries in epitaxial wurtzite GaN
  Xin Y, Brown PD, Humphreys CJ, Cheng TS, Foxon CT
  Applied Physics Letters, Aip Publishing vol. 70 (10), 1308-1310.  
  DOI 10.1063/1.118520
  
  10-03-1997
• Microstructural characterisation of GaN(As) films grown on (001) GaP by molecular beam epitaxy
  Xin Y, Brown PD, Dunin-Borkowski RE, Humphreys CJ, Cheng TS, Foxon CT
  Journal of Crystal Growth, Elsevier Bv vol. 171 (3-4), 321-332.  
  DOI 10.1016/s0022-0248(96)00663-x
  
  01-02-1997

1996

• Scanning transmission electron beam induced conductivity investigation of a Si/Si1−xGex/Si heterostructure
  Brown PD, Humphreys CJ
  Journal of Applied Physics, Aip Publishing vol. 80 (4), 2527-2529.  
  DOI 10.1063/1.363038
  
  15-08-1996
• Atom positions in the R-phase unit cell in TiNi shape memory alloy
  Chen Q, Knowles KM, Humphreys CJ, Wu XF
  Journal of Materials Science, Springer Science and Business Media Llc vol. 31 (16), 4227-4231.  
  DOI 10.1007/bf00356443
  
  01-08-1996
• Missed opportunities for high-temperature superconductivity
  Harrowell RV
  Physics World, IOP Publishing vol. 9 (8), 15-15.  
  DOI 10.1088/2058-7058/9/8/14
  
  01-08-1996
• Experimental and theoretical study of the electronic structure of Fe, Co, and Ni aluminides with theB2 structure
  Botton GA, Guo GY, Temmerman WM, Humphreys CJ
  Physical Review B, American Physical Society (Aps) vol. 54 (3), 1682-1691.  
  DOI 10.1103/physrevb.54.1682
  
  15-07-1996
• Electron-beam induced crystallization transition in self-developing amorphous AlF3 resists
  Chen GS, Boothroyd CB, Humphreys CJ
  Applied Physics Letters, Aip Publishing vol. 69 (2), 170-172.  
  DOI 10.1063/1.117361
  
  08-07-1996
• The Symmetry of Three-Beam Scattering Equations: Inversion of Three-Beam Diffraction Patterns from Centrosymmetric Crystals
  Moodie AF, Etheridge J, Humphreys CJ
  Acta Crystallographica Section a Foundations of Crystallography, International Union of Crystallography (Iucr) vol. 52 (4), 596-605.  
  DOI 10.1107/s0108767396001171
  
  01-07-1996
• High-resolution electron microscopy study of the junction between a coherent {111} and an incoherent {121} twin boundary in TiAl
  Inkson BJ, Humphreys CJ
  Philosophical Magazine A, Informa Uk Limited vol. 73 (6), 1647-1661.  
  DOI 10.1080/01418619608243004
  
  01-06-1996
• Dislocations at 120° order interfaces in TiAl
  Inkson BJ, Humphreys CJ
  Philosophical Magazine A, Informa Uk Limited vol. 73 (5), 1333-1345.  
  DOI 10.1080/01418619608245136
  
  01-05-1996
• Effect of a doping impurity on the formation of structural defects in CdTe irradiated by electrons and ions
  Loginov YY, Brown PD, Humphreys CJ
  Physics of The Solid State vol. 38 (4), 692-697.  
  01-04-1996
• Formation of structural defects in CdTe and CdZnTe heteroepitaxial layers grown on GaAs
  Loginov YY, Brown PD, Humphreys CJ
  Physics of The Solid State vol. 38 (2), 272-277.  
  01-02-1996
• Defect formation in ZnTe and (Cd,Zn)Te epitaxial layers grown on (001) GaAs
  Loginov YY, Brown PD, Humphreys CJ
  Inorganic Materials vol. 32 (1), 22-25.  
  01-01-1996
• Growth of GaN films on (0 0 1) and (1 1 1) GaAs surfaces by a modified MBE method
  Cheng TS, Foxon CT, Jeffs NJ, Hughes OH, Ren BG, Xin Y, Brown PD, Humphreys CJ et al.
  Mrs Internet Journal of Nitride Semiconductor Research, Springer Science and Business Media Llc vol. 1 
  DOI 10.1557/s1092578300002040
  
  01-01-1996

1995

• On the dissociation of prism plane superdislocations in Ti₃Al
  Wiezorek JMK, Court SA, Humphreys CJ
  Philosophical Magazine Letters, Informa Uk Limited vol. 72 (6), 393-403.  
  DOI 10.1080/09500839508242479
  
  01-12-1995
• A Correlation between Compositional Fluctuations and Surface Undulations in Strained Layer Epitaxy
  Walther T, Humphreys CJ, Cullis AG, Robbins DJ
  Materials Science Forum, Trans Tech Publications, Ltd. vol. 196-201, 505-510.  
  DOI 10.4028/www.scientific.net/msf.196-201.505
  
  01-11-1995
• The microstructure of MnSb grown on (001) GaAs by hot wall epitaxy
  Xin Y, Brown PD, Boothroyd CB, Humphreys CJ, Tatsuoka H, Kuwabara H, Oshita M, Nakamura T et al.
  Journal of Crystal Growth, Elsevier Bv vol. 156 (3), 155-162.  
  DOI 10.1016/0022-0248(95)00276-6
  
  01-11-1995
• Detection of random alloy fluctuations in high-resolution transmission electron micrographs of AlGaAs
  Walther T, Humphreys CJ, Grimshaw MP, Churchill AC
  Philosophical Magazine A, Informa Uk Limited vol. 72 (4), 1015-1030.  
  DOI 10.1080/01418619508239950
  
  01-10-1995
• Measurement of low-order structure factors for silicon from zone-axis CBED patterns
  Saunders M, Bird DM, Zaluzec NJ, Burgess WG, Preston AR, Humphreys CJ
  Ultramicroscopy, Elsevier Bv vol. 60 (2), 311-323.  
  DOI 10.1016/0304-3991(95)00058-1
  
  01-09-1995
• On the hierarchy of planar fault energies in TiAl
  Wiezorek JMK, Humphreys CJ
  Scripta Metallurgica Et Materialia, Elsevier Bv vol. 33 (3), 451-458.  
  DOI 10.1016/0956-716x(95)00212-e
  
  01-08-1995
• HREM studies of the (001) surface of YBa2Cu4O8
  Xin Y, Zhou W, Humphreys CJ
  Physica C: Superconductivity, Elsevier Bv vol. 249 (3-4), 319-332.  
  DOI 10.1016/0921-4534(95)00327-4
  
  01-07-1995
• Microtwin nucleation and propagation in heteroepitaxial II-VI compounds on (001)-oriented GaAs substrates
  Brown PD, Loginov YY, Stobbs WM, Humphreys CJ
  Philosophical Magazine A, Informa Uk Limited vol. 72 (1), 39-57.  
  DOI 10.1080/01418619508239581
  
  01-07-1995
• High-resolution electron microscopy observation of a¹/₂(112) superdislocation in TiAl
  Inkson BJ, Humphreys CJ
  Philosophical Magazine Letters, Informa Uk Limited vol. 71 (6), 307-312.  
  DOI 10.1080/09500839508241012
  
  01-06-1995
• Boride morphology in A (Fe, V, B) Ti-alloy containing B2-phase
  Inkson BJ, Boothroyd CB, Humphreys CJ
  Acta Metallurgica Et Materialia, Elsevier Bv vol. 43 (4), 1429-1438.  
  DOI 10.1016/0956-7151(94)00345-i
  
  01-04-1995
• A FRAMEWORK FOR THE FUTURE
  CAMPBELL J, HUMPHREYS C
  Materials World vol. 3 (6), 286-287.  
  01-01-1995
• Assessment of semiconductor epitaxial growth by transmission electron microscopy
  Brown PD, Humphreys CJ
  Materials Science and Technology, Sage Publications vol. 11 (1), 54-65.  
  DOI 10.1179/mst.1995.11.1.54
  
  01-01-1995

1994

• Benefits of energy filtering for advanced convergent beam electron diffraction patterns
  Burgess WG, Preston AR, Botton GA, Zaluzec NJ, Humphreys CJ
  Ultramicroscopy, Elsevier Bv vol. 55 (3), 276-283.  
  DOI 10.1016/0304-3991(94)90062-0
  
  01-09-1994
• Famines and cataclysmic volcanism
  WHITE RS, HUMPHREYS CJ
  Geology Today, Wiley vol. 10 (5), 181-185.  
  DOI 10.1111/j.1365-2451.1994.tb00421.x
  
  01-09-1994
• Transmission electron microscopy investigations of II–VI/GaAs heterostructures
  Brown PD, Loginov YY, Mullins JT, Durose K, Brinkman AW, Humphreys CJ
  Journal of Crystal Growth, Elsevier Bv vol. 138 (1-4), 538-544.  
  DOI 10.1016/0022-0248(94)90865-6
  
  01-04-1994
• Burgers vector determination of decorated dislocations in γ-TiAl by diffraction contrast and large-angle convergent-beam electron diffraction
  Wiezorek JMK, Preston AR, Court SA, Fraser HL, Humphreys CJ
  Philosophical Magazine A, Informa Uk Limited vol. 69 (2), 285-299.  
  DOI 10.1080/01418619408244344
  
  01-02-1994

1993

• Evolution and religion
  White RS, Humphreys C
  Nature, Springer Science and Business Media Llc vol. 366 (6453), 296-296.  
  DOI 10.1038/366296c0
  
  01-12-1993
• Microstructure of A γ−α2−β TiAl alloy containing iron and vanadium
  Inkson BJ, Boothroyd CB, Humphreys CJ
  Acta Metallurgica Et Materialia, Elsevier Bv vol. 41 (10), 2867-2876.  
  DOI 10.1016/0956-7151(93)90101-w
  
  01-10-1993
• Novel fabrication method for nanometer-scale silicon dots and wires
  Chen GS, Boothroyd CB, Humphreys CJ
  Applied Physics Letters, Aip Publishing vol. 62 (16), 1949-1951.  
  DOI 10.1063/1.109500
  
  19-04-1993

1992

• The Jewish Calendar, A Lunar Eclipse and the Date of Christ’s Crucifixion
  Humphreys CJ, Waddington WG
  Tyndale Bulletin, Tyndale House vol. 43 (2) 
  DOI 10.53751/001c.30487
  
  01-11-1992
• ULTIMATE LIMITS OF LITHOGRAPHY
  MORGAN C, CHEN GS, BOOTHROYD C, BAILEY S, HUMPHREYS C
  Physics World vol. 5 (11), 28-32.  
  01-01-1992

1991

• State of British science
  HUMPHREYS C
  Nature, Springer Science and Business Media Llc vol. 351 (6327), 513-513.  
  DOI 10.1038/351513a0
  
  13-06-1991
• The origin of dislocations in multilayers
  Humphreys CJ, Maher DM, Eaglesham DJ, Kvam EP, Salisbury IG
  Journal De Physique III, Edp Sciences vol. 1 (6), 1119-1130.  
  DOI 10.1051/jp3:1991175
  
  01-06-1991
• 100 keV electron beam damage of metals and oxides
  Humphreys C
  Micron and Microscopica Acta, Elsevier Bv vol. 22 (1-2), 147-148.  
  DOI 10.1016/0739-6260(91)90133-k
  
  01-01-1991
• THE STAR OF BETHLEHEM - A COMET IN 5 BC - AND THE DATE OF THE BIRTH OF CHRIST
  HUMPHREYS CJ
  Quarterly Journal of The Royal Astronomical Society vol. 32 (4), 389-407.  
  01-01-1991

1990

• Crucifixion date
  HUMPHREYS C, WADDINGTON WG
  Nature, Springer Science and Business Media Llc vol. 348 (6303), 684-684.  
  DOI 10.1038/348684a0
  
  27-12-1990
• Variation of dislocation morphology with strain in Ge_xSi_1−x epilayers on (100)Si
  Kvam EP, Maher DM, Humphreys CJ
  Journal of Materials Research, Springer Science and Business Media Llc vol. 5 (9), 1900-1907.  
  DOI 10.1557/jmr.1990.1900
  
  01-09-1990

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