Publications

 
  • STEM/EDX microanalysis of compositional fluctuations in semiconductor multi-quantum-well structures
    Bullock JF, Titchmarsh JM, Humphreys CJ
    Semiconductor Science and Technology, IOP Publishing vol. 1 (6), 343-345.  
    01-12-1986
  • The austenite grain structure of low-alloy steel weld deposits
    Bhadeshia HKDH, Gretoft B
    Journal of Materials Science vol. 21 (11), 3947-3951.  
    01-11-1986
  • ON REDUCING THE ORDER OF TRANSFER-FUNCTIONS
    VEPA R
    J Dyn Syst-T Asme vol. 108 (3), 270-272.  
    01-09-1986
  • White lines in theL2,3electron-energy-loss and x-ray absorption spectra of3dtransition metals
    Waddington WG, Rez P, Grant IP, Humphreys CJ
    Physical Review B, American Physical Society (Aps) vol. 34 (3), 1467-1473.  
    01-08-1986
  • Reaction dynamics studied via positron and electron spectroscopy
    Krieg R, Boek E, Gollerthan U, Kankeleit E, Krämer M
    Physical Review C, American Physical Society (Aps) vol. 34 (2), 562-575.  
    01-08-1986
  • Electron-beam damage observed in the fast proton conductor ammonium/hydronium β''-alumina: a high-resolution electron microscope (HREM) study
    Petford AK, Humphreys CJ
    Acta Crystallographica Section B Structural Science, International Union of Crystallography (Iucr) vol. 42 (3), 224-229.  
    01-06-1986
  • Fe-Cr-C hardfacing alloys for high-temperature applications
    Svensson L-E, Gretoft B, Ulander B
    Journal of Materials Science, Springer Nature vol. 21 (3), 1015-1019.  
    01-03-1986
  • Compositional Studies of Semiconductor Alloys by Bright Field Electron Microscope Imaging of Wedged Crystals
    Eaglesham DJ, Hetherington CJD, Humphreys CJ
    Mrs Proceedings, Springer Science and Business Media Llc vol. 77 
    01-01-1986